http://conference2008.msc-smc.org/ 2012-02-22T14:23:26-07:00 http://conference2008.msc-smc.org/ http://conference2008.msc-smc.org/lib/images/favicon.ico text/html 2008-05-19T10:08:27-07:00 mlagace http://conference2008.msc-smc.org/doku.php?id=meeting2008:home&rev=1211216907&do=diff Microscopical Society of Canada Welcome to the website for the SMC-MSC 2008 Annual Meeting. The SMC-MSC will be celebrating its 35th anniversary in 2008. The annual meeting will take place in Montréal on May 20-23, 2008, and will be hosted by McGill University. The theme for this special year will be “35 Years of Progress, from Micro to Nano…” Short courses will be held on May 20th and 23rd. text/html 2008-05-19T10:01:48-07:00 mlagace http://conference2008.msc-smc.org/doku.php?id=meeting2008:news:news&rev=1211216508&do=diff Meeting News May 2008 * Course 06 Focused Ion Beam has changed from a full day course to half a day. It will take place Tuesday afternoon at École Polytechnique. * No registration reimbursement will be made after May 15. * As a result of requests from several exhibitors who wish to invite guests from industry for demos at their booths, we are offering a special registration for these guests. The Exhibition Guest pass will cost $25 and the registration can be done before the Exhibition. P… text/html 2008-05-19T09:58:05-07:00 mlagace http://conference2008.msc-smc.org/doku.php?id=meeting2008:workshops:fib&rev=1211216285&do=diff Focused Ion Beam (FIB) Instructors: Gilles Lespérance 1 session, half day, tuesday afternoon Room: École Polytechnique de Montréal Maximum participants: to be determined Fees: $100 Description Focused Ion Beam (FIB) has become invaluable for preparation of samples for transmission electron microscopy (TEM). text/html 2008-05-16T07:45:51-07:00 mlagace http://conference2008.msc-smc.org/doku.php?id=meeting2008:workshops:imageanalysis&rev=1210949151&do=diff Image Analysis Instructors: Sidnei Paciornik 1 session, full day, tuesday Room: Wong Building Room 3180 Maximum participants: None Fees: $100 Description Even though technology gives us the ability to easily resolve nanometer-scale features, microstructural imaging still only gives researchers qualitative information. Microstructure comparison between different materials is still dependant on subjective evaluation by the operator. Furthermore, as magnification is increased, the overal… text/html 2008-05-16T05:58:36-07:00 phovington http://conference2008.msc-smc.org/doku.php?id=meeting2008:shortcourses:shortcourses&rev=1210942716&do=diff Short Courses Complementing the scientific program, several short courses are offered that will provide training in advanced methods in microscopy. These courses consist of theoretical lectures and/or instrument demonstrations. They are designed to meet the needs of students, principal investigators and technical personnel. For some courses, participants are encouraged to bring their own specimens. text/html 2008-05-16T05:57:50-07:00 phovington http://conference2008.msc-smc.org/doku.php?id=meeting2008:workshops:specimenprep&rev=1210942670&do=diff Advanced Specimen Preparation (FIB) and High Resolution IN-SITU Instructors: * T. Kamino (Hitachi High Technology) * Rocco R. Cerchiara, Ph. D. - Application Specialist, E.A. Fischione Instruments, Inc. 2 sessions, full day, Friday Room: Wong Building Room 1050 text/html 2008-05-16T05:43:35-07:00 phovington http://conference2008.msc-smc.org/doku.php?id=meeting2008:workshops:ebsd&rev=1210941815&do=diff EBSD Techniques and Applications Instructors: * Dr. Stefan Zaefferer - Head of research group diffraction and microscopy, Max Planck Institute for Iron Research * Dr. G. Vander Voort - Director of Research & Developpement, Buehler Ltd. * Rocco R. Cerchiara, Ph. D. - Application Specialist, E.A. Fischione Instruments, Inc. text/html 2008-05-15T13:18:06-07:00 mlagace http://conference2008.msc-smc.org/doku.php?id=meeting2008:shortcourses:shortcourseroomassignment&rev=1210882686&do=diff Short Courses Room Assignation A map with the location of the different building can be found here.